Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP

Indexed in ScopusISSN 2836-8487E-ISSN 2768-1874 ieeexplore.ieee.org

Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP appears as an active journal in the Scopus source list (June 2026 edition).

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